Atrenta Introduces Early PPA Analysis at ARM TechCon 2011

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Using ARM's AMBA® Designer and its SpyGlass® and GenSys® product families, Atrenta will demonstrate how to perform Early PPA analysis on AMBA-based designs at ARM TechCon 2011 on Tuesday, October 25.

San Jose, CA, United States., October 24, 2011 - (PressReleasePoint) 

What:
Using ARM's AMBA® Designer and its SpyGlass® and GenSys® product families, Atrenta will demonstrate how to perform Early PPA analysis on AMBA-based designs.  
 
When:
Tuesday, October 25, 2011

Where:
ARM TechCon 2011, Santa Clara Convention Center, Santa Clara, CA. Table #19
 
Why:
Defining the correct interconnect architecture for complex system on chip (SoC) designs can be challenging, requiring multiple back-end iterations. Early PPA analysis can reduce these iterations by helping to answer questions about the design up-front, such as:
 
1. What is the performance, power and area of the SoC being planned (PPA)?
 
2. Can “what-if” analysis be quickly performed to zoom-in on a high-confidence architecture?
 
3. Can I capture architectural intent, validate it and provide forward guidance for implementation?
 
Notes:
For information about the ARM TechCon 2011, visit: http://events.ubm.com/event/1153/the-arm-technology-conference