CAPRES A/S Ships its First microRSP-A300 Automated Metrology System to a Leading Foundry in Asia

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CAPRES A/S Ships its First microRSP-A300 Automated Metrology System to a Leading Foundry in Asia to ensure high end sheet resistance measurement on product wafers at micron scale. Based on microscopic 4PP, the technique is the only direct and accurate micron scales sheet resistance measurement capable of beyond 40nm node production control.

12 March 2010 - Copenhagen, DENMARK - CAPRES A/S, a Danish developer of next generation semiconductor metrology systems for the direct nano- and micro-scale electrical characterization of materials, announced today the first shipment of its fully automated 300mm microRSP-A300 to an industry leading foundry located in Asia. With the development and production release of the microRSP-A300, CAPRES has addressed the challenges associated with in-line measurement on production wafers, thereby reducing reliance on data extrapolation and costly monitor wafers to validate doping levels.

The tool is currently being installed and is scheduled to be qualified for production during the second quarter of 2010. The initial application of the tool will be to monitor sheet resistance of very thin films on product wafers. This production application of micro-scale sheet resistivity measurement allows, for the first time, immediate detection of process deviations thereby shortening the production control loop and enabling a commensurate reduction in work-in-process and losses due to out-of-specification production processes.

“A number of companies, including this new customer, are finding that conventional Rs and optical metrology tools are not capable of measuring the sheet resistance of the very thin conductive films needed for production processes beyond the 40nm node We were selected after several rounds of blind benchmarks that proved our accuracy and repeatability on product wafers,” said Bo Hansen, CEO of CAPRES A/S.

About CAPRES

CAPRES A/S was established in 1999 and is a leading supplier of micro-scale metrology systems for the semiconductor and magnetic storage industries. The company has installed tools in Europe, Asia, and North America addressing a range of leading-edge metrology requirements. CAPRES metrology solutions utilize the company’s patented MEMS-based probe technology and are available in manual and fully automated configurations. CAPRES is backed by some of Scandinavia’s leading institutional investors include LD Pensions, Dansk Erhvervsinvestering, SEB Venture Capital, and CAT Invest.

More information? Visit www.capres.com

Capres A/S
Diplomvej 373
2800 Kgs. Lyngby, Danemark
Tel +45 88 82 14 70 Fax +45 88 82 14 99
sales@capres.com