Modules for widely adopted MAP and T-BERD®/MTS platforms enable WDM network element lab development, manufacturing, and network deployment
March 6, 2014 — JDSU today announces a range of spectral characterization solutions to address development, integration, and deployment of next-generation high-speed networks. Engineered for the widely-adopted Multiple Application Platform (MAP) and T-BERD/MTS-6000A modular platforms, the modules enable deployments up to 400 G in both lab and production and field network environments.
EOSA610 high-resolution OSA for T-BERD/MTS-6000A V2 and T-BERD/MTS-8000 is the world’s first portable solution that supports field deployments for 400 G Nyquist and flexible-grid DWDM networks.
Provides sub-GHz wavelength resolution performance needed to qualify high-speed optical wavelength devices from development to volume production.
Lowers costs in WDM device volume production starting with minimizing test station footprint and downtime. The MAP solutions integrate into MAP-230 or MAP-280 chassis to minimize space requirements. They also lack moving parts which dramatically improves long-term reliability and minimizes test-station downtime.
Supports NEM qualification of 400 G Nyquist and flexible-grid DWDM networks with first-in-class capabilities that conventional field OSAs cannot provide.
As the demand for more and more bandwidth continues unabated, high-speed optical devices are critical enablers to providing this capacity. Whether in a development lab, volume production, or network deployment, bringing 10 G, 100 G, and 400 G wavelength devices to market and online faster is critical. Now users can perform necessary high-resolution testing up front with these smaller, reliable solutions. Their innovative design eliminates moving parts providing much more robust solutions for use in both production or field test environments.