JDSU Introduces the Most Complete Portfolio of High-Resolution Spectral Solutions for up to 400 G

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Modules for widely adopted MAP and T-BERD®/MTS platforms enable WDM network element lab development, manufacturing, and network deployment


March 6, 2014 — JDSU today announces a range of spectral characterization solutions to address development, integration, and deployment of next-generation high-speed networks. Engineered for the widely-adopted Multiple Application Platform (MAP) and T-BERD/MTS-6000A modular platforms, the modules enable deployments up to 400 G in both lab and production and field network environments.


Lab and Production


  • MAP mWAVE is the world’s most compact high-resolution multiwavelength meter for WDM component spectral characterization from sub-10 G through 400 G.
  • MAP mHROSA offers a high-resolution optical spectrum analyzer (OSA) that brings next-generation wavelength testing innovation to optical lab and manufacturing environments.


Field Network Turn-Up and Troubleshooting


  • EOSA610 high-resolution OSA for T-BERD/MTS-6000A V2 and T-BERD/MTS-8000 is the world’s first portable solution that supports field deployments for 400 G Nyquist and flexible-grid DWDM networks.


Key Benefits


  • Provides sub-GHz wavelength resolution performance needed to qualify high-speed optical wavelength devices from development to volume production.
  • Lowers costs in WDM device volume production starting with minimizing test station footprint and downtime. The MAP solutions integrate into MAP-230 or MAP-280 chassis to minimize space requirements. They also lack moving parts which dramatically improves long-term reliability and minimizes test-station downtime.
  • Supports NEM qualification of 400 G Nyquist and flexible-grid DWDM networks with first-in-class capabilities that conventional field OSAs cannot provide.


Use Cases


As the demand for more and more bandwidth continues unabated, high-speed optical devices are critical enablers to providing this capacity. Whether in a development lab, volume production, or network deployment, bringing 10 G, 100 G, and 400 G wavelength devices to market and online faster is critical. Now users can perform necessary high-resolution testing up front with these smaller, reliable solutions. Their innovative design eliminates moving parts providing much more robust solutions for use in both production or field test environments.


Visit us at OFC (booth # 1315) to see these solutions and to speak with one of our experts. Also, read more about our WDM test solutions for lab and production or field network deployment.

News Source : JDSU Introduces the Most Complete Portfolio of High-Resolution Spectral Solutions for up to 400 G

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